SN74BCT8244ANT

Manufacturer: Texas Instruments
Category: Specialty Logic

Description

IC SCAN TEST DEVICE BUFF 24-DIP

Technical Parameters

Parameter Value
Product Status Obsolete
Logic Type Scan Test Device with Buffers
Supply Voltage 4.5V ~ 5.5V
Number of Bits 8
Operating Temperature 0°C ~ 70°C
Mounting Type Through Hole
Package / Case 24-DIP (0.300", 7.62mm)
Supplier Device Package 24-PDIP

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